Capacitor detection description error cause

Do capacitor defects contribute to infant and latent failures in integrated circuits?

Capacitor defects significantly contribute to infant and latent failures in integrated circuits. This paper will address methods of locating capacitor defects and root cause determi-nation. Keysight Technologies’ failure analysis team investigated tens of failures in an externally purchased voltage controlled oscillator (VCO).

How to detect capacitor fault in a high frequency oscilloscope?

The EMD method was combined with the chaos synchronisation detection method to chart the discharge signals of the voltage and current that was captured by a high frequency oscilloscope into a 3D chaotic error scatter plot, as the fault diagnosis feature image. Finally, the CNN algorithm was used for the capacitor fault detection.

What causes a capacitor to fail?

Keysight Technologies’ failure analysis team determined the root cause of these failures to be voids in the capacitor dielectric layer. The voids allowed the propagation of metal into the dielec-tric layer. This metal migration led to latent failures in the field.

What are the advances in capacitor failure analysis?

Advancements in failure analysis have been made in root cause determination and stress testing methods of capacitors with extremely small (approximately 200 nm) defects. Subtrac-tive imaging has enabled a non-destructive means of locating a capacitor short site, reducing the FIB resources needed to analyze a defect.

How can you tell if a capacitor is failing?

There were no visual deformities seen under standard microscopy on the capacitor’s top metal. Most subtle failures in a capacitor are those in the dielectric which are difficult to find under standard spectroscopy . To determine the location of the short, a current of 50 mA was forced through the failed capacitor.

Does a power capacitor fault detection system have a high accuracy rate?

As seen, the accuracy of the proposed method with noise is still higher than 90%, compared to the other algorithms. Therefore, the power capacitor fault diagnosis recognition system proposed in this paper has a high recognition accuracy rate, as well as better resistance to noise than the other algorithms. TABLE 5.